Objective: testing time gain compensation and acquisitions
Testing new version of FPGA bin (category: graph).
Testing new version of FPGA bin (category: graph).
Testing new version of FPGA bin (category: graph).
Testing new version of FPGA bin (category: graph).
Testing new version of FPGA bin (category: graph).
Testing new version of FPGA bin (category: graph).
Testing new version of FPGA bin (category: graph).
Testing new version of FPGA bin (category: graph).
Testing new version of FPGA with TGC (category: graph).
Testing new version of FPGA bin (category: graph).
Testing new version of FPGA bin (category: graph).
Testing new version of FPGA bin (category: graph).
Detail of a TGC line (category: graph).
Testing new version of FPGA bin (category: graph).
Testing new version of FPGA bin (category: graph).
Testing new version of FPGA bin (category: graph).
Testing new version of FPGA bin (category: graph).
Testing new version of FPGA bin (category: graph).
Detail of pulser (category: oscilloscope).
Linear gain from 0 to 1000 in 200us (category: oscilloscope).
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