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refleX - A system for automatic anomaly detection in X-ray diffraction images.

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refleX

A system for automatic anomaly detection in X-ray diffraction images


Description

RefleX is a machine learning system that aims to automatically detect seven classes of anomalies that may appear in X-ray diffraction images.

Dataset

The dataset contains 6311 X-ray diffraction images in 1024x1024 png format (reflex_img_1024_inter_nearest.zip). The repository also contains a file mapping each image to a set of labels (labels.csv) and files describing the assignment of each image to training, validation, and testing sets (labels_train.csv, labels_val.csv, labels_test.csv).

Click here to download the dataset.

Installation

  • conda env create -f environment.yml
  • Add lib/fastai to PYTHONPATH

Docs

Under construction