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Add HIL tests for all peripherals which are practical to test #1334
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One reference for the peripherals is the list @SergioGasquez created here: #809 (comment) |
I will be working on RSA |
I will be working on CRC |
Working on usb-serial-jtag |
Working on SHA |
Working on clock monitoring |
I'm currently stuck with usb-serial-jtag, I will work on debug-assist next. |
I will also try to add |
I want to write a HIL test for the |
How many connected pins would you need? Feel free to suggest any pins that you would like to get connected, see #1332 (comment) which might be helpful. |
4 total pairs. A clock pin, a data pin, and two ctrl pins. According to https://github.com/esp-rs/esp-hal/tree/main/hil-test:
I suppose a strategic choice for two more pairs would be:
My strategy there was to connect a pin with a specific function to another pin with no functions. |
Awesome, I'll try to get those pins connected in the upcoming days. On the ESP32-S3, the following would be added:
|
@Dominaezzz, our S3 self-hosted runner already has the connections we discussed. |
As discussed in our team meeting today, it would be nice to come up with some method of testing the TWAI peripheral, whether this be via loopback, external tranciever, or some other solution. |
We can maybe tick systimer after #1979 |
Now that we've got #2128 those extra S3 connections can be removed, as they now get in the way of finding dummy pins. The LCD_CAM HIL test works without the extra connections atm. |
Yeah those are biting me as well on the 32 I think. We probably need some, though, so let's not mindlessly rip off everything :D |
This is going to be an eternal issue, there will always be new things to test and new devices are released and new use cases/APIs arise, so I am going to close this and we can open individual issues for peripherals as the need arises. |
For now, let's use the table from #809 (comment):
Delay
HIL test #1415I2C
HIL test #2023UsbSerialJtag
peripheral #1961The text was updated successfully, but these errors were encountered: