tests/pbkdf2: de-flaky-fy test [backport 2022.10] #18941
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Having to cast a password provided as `const char *` to `const uint8_t *` is a needless pain in the ass when using the API. Hence, fix it by accepting passwords and salts as `const void *` instead. (cherry picked from commit e92a716)
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Murdock results✔️ PASSED 2f6dd98 tests/pbkdf2: de-flanky-fy test
ArtifactsThis only reflects a subset of all builds from https://ci-prod.riot-os.org. Please refer to https://ci.riot-os.org for a complete build for now. |
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seems to choke on the moved macro includes. |
Previously, the test vectors were encoded into the python test scripts, converted to base64, and send over to the device under test via stdio. The application sent back the output after converting it to base64 first, which was read back in by the test script and decoded. Finally, the test script compared the result with the expected result. This made the test complex, slow and, flanky, as stdio on interfaces such as UART has a high bit error rate and some quirks (e.g. the EDBG UART bridge e.g. in the samr21-xpro dropping bytes when bursts of more than 64 bytes at a time are send). This basically rewrites the test to embed the test vectors in the firmware and do the comparison on the devices. This fixes test failures on the samr21-xpro, the nRF52840-DK and likely many others. Also, it is now fast.
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Nov 22, 2022
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Thx :) |
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Backport of #18932
Contribution description
Previously, the test vectors were encoded into the python test scripts, converted to base64, and send over to the device under test via stdio. The application sent back the output after converting it to base64 first, which was read back in by the test script and decoded. Finally, the test script compared the result with the expected result.
This made the test complex, slow and, flanky, as stdio on interfaces such as UART has a high bit error rate and some quirks (e.g. the EDBG UART bridge e.g. in the samr21-xpro dropping bytes when bursts of more than 64 bytes at a time are send).
This basically rewrites the test to embed the test vectors in the firmware and do the comparison on the devices. This fixes test failures on the samr21-xpro, the nRF52840-DK and likely many others. Also, it is now fast.
Beware: This sneaks in a non-API-change-API-change: The password and salt is now passed as
const void *rather than asconst uint8_t *, as having to cast c-strings toconst uint8_t *is a needles pain in the ass.Testing procedure
should pass. Changing one bit in the expected digest in one of the test vectors should result in the test to no longer pass.
Issues/PRs references
None